Failure Analysis

Failure Analysis

Oxford Instruments Plasma Technology, the market leader in 300mm dry etch for Failure Analysis offers a unique range of de-processing solutions.

This family of tools offers:

  • A range of processes from passivation removal to anisotropic oxide removal including TEOS for gap fill,
    processing across a range of customer product sizes from small die or packaged device through to full 300 mm wafer
  • A choice of tool  from entry level manual load,  to  load locked 300mm production FA
  • A choice of technologies from RIE/PE to ICP etch
  • Advanced die process
      • Etch rate 20 times faster than standard RIE processes using the Plasma Accelerator
  • Flexible tools offering a whole range of processes
      • µetch300 for 300mm wafer
      • µetchICP is a fast and low damage tool for small die and packaged device
      • µetch200 for 200mm wader
      • TEOS process for gap fill

Oxford Instruments Plasma Technology also offers process support both in house and in field, and actively supports customer process development.

 

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