Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
- Nearly 40 years experience in EDS, WDS and EBSD allows us to provide microanalysis systems that deliver insights down to the nanometre level
- We provide application-specific solutions such as Gunshot Residue Analysis, Mineral Liberation, ThinFilm analysis and more.
- Through our Omniprobe products, we have the ability to physically manipulate samples inside the microscope to prepare TEM or atom probe samples, study nanowires, and build nanoassemblies.
- With our integrated solutions we can layer films at the atomic level and measure their thickness, perform fault isolation, failure analysis and the measurement of mechanical and electrical properties – all
at the nanoscale.
- We have the largest user community in the market and provide worldwide support, application assistance and consulting services
- Our innovative technology delivers faster, more accurate analysis for both research and industrial applications
Technologies
- Wavelength Dispersive Specroscopy (WDS)
Applications
- Elemental analysis of materials at the micro- and nano- scale
- Full spectral X-ray mapping
- Microstructural analysis including crystal orientation mapping, grain size analysis, phase identification
- Failure analysis and quality control
- Automated Mineral Liberation Analysis
Application specific solutions include: