When the performance you get really is the best!
The new X-Max large area silicon drift detectors for the SEM have been a runaway success! Customers are discovering that the larger the crystal, the higher the countrate; the faster the analysis, the higher the productivity.
Put simply, by reducing the analysis time, results can be collected faster and more efficiently, thus giving high throughput with no sacrifice in resolution!
Customers who upgrade their traditional LN2 Si(Li) detectors to the new, dry, state-of-the art X-Max enjoy better resolution combined with higher productivity leading to faster turnaround time of data.
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