Oxford Instruments NanoAnalysis provides the world’s most popular solutions for materials characterisation on Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM).
- Nearly 40 years experience in EDS, WDS and EBSD allows us to provide systems that deliver insights down to the nanometre level
- We have the largest user community in the market and provide worldwide support, application assistance and consulting services
- Our innovative technology delivers faster, more accurate analysis for both research and industrial applications
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Applications
- Elemental analysis of materials at the micro- and nano- scale
- Full spectral X-ray mapping
- Microstructural analysis including crystal orientation mapping, grain size analysis, phase identification
- Failure analysis and quality control
Application specific solutions include:
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