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The Nanotechnology Forum for Indian Scientists (NT Forum) is delighted to announce that Dr Arindam Ghosh from IISC, Bangalore is the first winner of the ‘Oxford...

Oxford Instruments Healthcare, a service division of Oxford Instruments that specializes in providing refurbished CT & MRI scanners for the medical industry, has again...

Everyone who works or studies in the world of materials and elemental analysis agrees on two guiding principles: Accuracy of analysis is vital and speed of analysis is critical...

Oxford Instruments is delighted to announce the winner of the 2015 Lee Osheroff Richardson Science Prize for North America as Dr. Cory R. Dean, Assistant Professor, Department...

Oxford Instruments has successfully developed and installed a compact, high field, high stored energy superconducting magnet system at the Dresden High Magnetic Field...

Ground breaking research into graphene and other 2D materials will take place at The University of  Manchester’s new National Graphene Institute using multiple,...

The speed, resolution and sensitivity of the Andor Zyla sCMOS camera has allowed the Vaziri research group in Vienna, Austria, to simultaneously image neuronal activity across...

Oxford Instruments Healthcare, a division of Oxford Instruments that specializes in providing refurbished CT & MRI scanners, announces that they have partnered with CURA...

Oxford Instruments plc, a leading provider of high technology tools and systems for industry and research, today issues a Quarter 3 Trading Update which covers the period from...

Oxford Instruments Asylum Research has released a new application note, “AFM Applications in Polymer Science and Engineering,” written by former NIST researcher Dr....

Many hospitals and medical facilities have their own biomedical engineers and now on top of specializing in CT & MRI equipment, maintenance, parts and mobile units, Oxford...

An agreement has been signed between one of the largest semiconductor companies in Europe and Oxford Instruments for the supply of multiple Failure Analysis (FA) systems, to be...