Coating thickness measurement and materials analysis to improve process and quality control with X-ray fluorescence (XRF)
The X-Strata is a compact, rugged and reliable quality control XRF benchtop system for simple, rapid, non-destructive coating thickness measurement and materials analysis.
It performs excellent coating thickness analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay.
The coating thickness measurement analyser X-Strata range offers:
Non-destructive analysis: no sample preparation
Field-proven technology and reliability ensuring value for money year after year
Easy to use, with minimal user training required
Analysis in only three simple steps
Outstanding precision and accuracy of analysis
Culmination of over 20 years knowledge and experience in the coatings industry
Coating thickness measurement with the powerful and easy to use XRF spectrometer guarantees quality and reduces costs.