Coating Thickness Measurement and Materials Analysis - X-Strata Range

High performance accuracy and long-term stability

• Fast and precise analysis for production cost optimisation
• Accurate determination of elemental thickness
• Optimised performance across a wide range of elements

Rugged and robust design

• Operation by the production line or in a laboratory
• Ease of use for production staff

Simple calibration setup

• Analytical methods (empirical or Fundamental parameters, FP) provide simplicity and reliable quantitative results when no calibration standards are available
• Methods are created in minutes
• We supply certified standards for best accuracy (A2LA and ISO/IEC17025 accredited)
• Preloaded calibration parameters available

Analysis of variety of sample shapes and sizes

• Analyse a wide range of sample types from miniature electronic components to bathroom fittings
• A range of hardware options is available to suit every need

Electronics - Increase productivity with better process control

• Analysis of gold and palladium thickness of electrical contacts, for example Au/Ni/Cu
• Measurement of solderability on printed circuit boards such as Ag/Cu/Epoxy

Metal Finishing - Minimise production cost of the plating process and maximise production output

• Multi sample and multi point analysis
• Single or multi layer thickness measurement
• Plating bath analysis

Precious Metals / Metal Alloys - Rapid, non-destructive analysis of jewellery and other alloys

• Gold analysis, i.e. Karat and other elements determination
• Precious metal alloy assay

Compliance testing -  Ensure products conform to specifications

• Determination of hazardous substances from ppm to high % levels
• Quantification of toxic elements e.g. Cd, Hg, Pb etc to verify compliance
• RoHS screening following IEC62321
• High reliability testing for aerospace - positive identification of leaded solder

Alternative Energy - Ensure product efficiency and uniformity

• Thin-film photovoltaic cells - composition analysis of the thin-film absorber layer (e.g. CIS, CIGS, CdTe)
• Optimised electrical conductivity through layer thickness analysis

X-Strata920 - Three Configurations to suit your needs:

Standard base

• A “slotted chamber” allows the measurement of a wide range of samples from small components to very large flat samples, e.g. printed circuit board. The size of the sample can exceed the width of the instrument
• Economical and practical
• For the analysis of samples up to 33mm (1.3”) in height

Mini-well base

• The “Mini-Well” chamber design allows the measurement of a wide range of parts/components from small to large, i.e. up to 160mm (6.3”) in height
• Sample tray which can be positioned in one of four positions in the “Mini-Well” to hold samples of differing height, ensuring a range of parts/components can be measured with ease
• A "slotted chamber" allows the measurement of large flat samples, e.g. printed circuit boards whose size can exceed the width of the instrument

Programmable XY base

• A motorised and programmable table allows automatic measurements for highest sample throughput and unattended operation. 
• Mouse control enables easy positioning of the parts/components being analysed to the precise points for analysis
• The "Slotted chamber" allows large flat samples to be measured, e.g. printed circuit boards
• Table size: 56mm (22") D x 61mm (24") W

X-Strata920

X-Strata980

Download here your X-Strata brochures

To find out more about coating thickness measurement and materials analysis download our X-Strata920 and X-Strata980 brochures:

• Coating thickness measurement with the X-Strata920
• Coating thickness measurement with the X-Strata980

 If you require application notes, please contact us to discuss your specific application needs.

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