CMI243 - coating thickness measurement for conductive coatings

CMI243
CMI563

CMI243 measures coating thickness measurement for conductive coatings over conductive substrates.
The CMI243 package enables control of plating coating processes using advanced eddy-current technology.  It provides non-destructive coating thickness measurement for conductive coatings over conductive substrates. 

The system is specially designed to handle the needs of platers, coaters, and quality professionals.  The standard package consists of a control unit, an ECP-m eddy current probe and a set of Zn on Steel NIST traceable calibration standards.  The ECP-m probe is specifically tailored for metallic coatings on metallic substrates such as Zn on Steel. 

  • Applications 
  • Features 
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  • Measure metallic coatings on ferrous substrates, non-conductive coatings over nonmagnetic substrates and conductive coatings on nonconductive substrates (ECP-m Eddy Current Probes)
    • Zn, Cd, Cr, Ni, Cu on Steel, Organic, Paint & Powder Coats on Al, Anodize on Al etc.
  • Accurately quantify coating thickness after deposition
  • Eddy Current: Conforms to ASTM B244 & B259, DIN 50984, ISO 2360 and BS 5411 Part 3
  • Instrument is a is a 16-key handheld device powered by a 9V battery
  • Measurements can be taken in automatic or continuous modes
  • Scanning option compensates for uneven or textured substrate materials, enhancing performance of gauge repeatability and reproducibility
  • Memory capacity for over 12,000 readings accommodates high usage applications
  • Statistical data analysis, mean, standard deviation, high and low reading, Histogram and Cpk available with printer or serial output
  • RS232 PC connectivity
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