Production and Quality Control Analysers for Coating Thickness Measurements

Coatings XRF Analysis

X-Strata980 and CMI900
 

Oxford Instruments provides a wide range of analytical instruments for the measurement of coating thickness and material composition. As well as dedicated product solutions for the electronics manufacturing Industry, our superior instrumentation assures quality measurement for RoHS compliance screening, testing for the presence of lead and high-reliability electronics. 

We balance science, technology and an understanding of our customers’ needs to provide accurate measurement solutions.  

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