XRF Coating Thickness Measurement and Elemental Analysis - CMI900

CMI900
CMI900

CMI900  is a cost effective, rapid and high performance XRF analyser for measurement of coating thickness and material composition.  

High performance XRF spectrometer

  • Fast and precise analysis: proportional counter detector and 50 watt micro-focus X-ray tube provide high sensitivity
  • Simple element differentiation: secondary beam filters enable the spectral separation of overlapping elements
  • Optimised performance across a wide range of elements: optimised, preset methods of parameters.
    CMI900 is supplied with over 800 pre-loaded application parameters/methods
  • Excellent long-term stability:
    • Automatic thermal compensation measures the instrument temperature and corrects for changes, giving stable results
    • Simple and rapid Spectrum Calibration routine checks the instrument performance (such as sensitivity) and
      applies necessary corrections

Rugged and robust design

  • Operation in a lab or by the production line
  • Sturdy, industrial design
  • Field-proven technology, with over 3,000 instruments sold worldwide

 

  • Electronics 
  • Metal Finishing 
  • Metal Alloys 
  • Three options 
  • Simple Calibration 

 

Electrical and electronic components
Increase productivity with better process control
  • Component reliability assurance
    • Solder alloy composition and thickness measurement
  • Lifetime product assurance through optimised quality control
    For example:
    • Analysis of gold and palladium thickness of electrical contacts
    • Coating thickness of NiP layer on
      computer hard discs
 CMI900 and Electronics

Minimise production cost of the plating process and maximise production output

  • Speed and simplicity of analysis
    • Single or multi elements coating thickness analysis and coating composition
    • Analysis of up to 4 layers
    • Plating bath analysis
 CMI and Metal Finishing

  •  Rapid, non-destructive analysis of jewellery and other alloys
    • Precious metal alloy assay
    • Karat analysis
    • Material identification
 CMI900 and Metal Alloys

 

 Mini well

  • Adjustable in one inch
    (12.7mm) increments, this
    rack-styled chamber can
    accommodate parts up to
    6.30”(160mm) in height

 
 

 CMI900 Mini well

 

 

 

 

 

 Fixed table

  • Table position is fixed
  • Economical and practical
  • This flat base assembly provides a platform ideally suited for parts that do not exceed 1.30” (33mm) in height
  • Each of the three base
    options is slotted to
    accommodate oversized
    samples such as large
    printed circuit boards 

 CMI900 Fixed table

 

Programmable table

  • This configuration provides
    users with automatic,
    programmable control of
    the parts being analysed
  • Easily navigate the table
    to position the part being
    inspected to the precise point
    to be measured
  • Standard table size is
    22” (D) x 24” (W)
    (560 mm x 600 mm)
  • Travel is 7” x 7”
    (177.8 mm x 177.8 mm) 

 

 CMI900 Programmable table

 

     

    Simple calibration setup

    • When no standards are available, standardless (fundamental parameters – FP) analysis provides simplicity of setting up and reliable quantitative results, while covering a wide range of thicknesses and concentrations
    • When standards are available, Empirical calibrations provide the best accuracy. Only a few standards are necessary (typically 1 to 3)
    • Methods are created in minutes
    • Oxford Instruments supply certified standards for best accuracy (A2LA and ISO/IEC 17025 accredited)
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