Analysis of Trace Elements and Coating Thickness - X-Strata980

X-Strata980

The X-Strata980 has been designed to improve process and quality control with its outstanding precision, accuracy,and long-term stability:

Fast and precise analysis: high sensitivity with Oxford Instruments’ 100 W X-ray tube
Simple identification and differentiation of elements: high resolution, Peltier-cooled silicon PIN detector
Optimised performance across a wide range of elements: multiple primary beam filters
Measure samples as small as 150 μm in size: multiple collimators
Low limits of detection, even in matrices such as plastics: Oxford Instruments’ unique low-background measurement plate

Electrical and electronic components

Increase productivity with better process control

Component reliability assurance
– Simultaneous solder alloy composition
and thickness measurement
Lifetime product assurance through
optimised quality control
– Analysis of gold and palladium
thickness of electrical contacts
– Coating thickness of NiP layer on´
computer hard disc
Analysis of very thin coatings
(e.g. Au/Pd coatings of < 0.1 μm)

Metal Finishing

Minimise production cost of the plating process
and maximise production output

High Reliability

RoHS/WEEE/ELV* compliance testing

Improve quality control to ensure products meet specifications

Determination of hazardous substances from parts per million
to high percent levels
Quantification of toxic elements e.g. Cd, Hg, Pb etc. to verify
compliance

*) Restriction of Hazardous Substances/
Waste Electrical and Electronics
Equipment/End of Life vehicles (directives)

Metal alloy composition and identification

Rapid, non-destructive analysis of jewellery and other alloys

Solar panels and fuel cells

Ensure product efficiency and uniformity

Composition analysis of the thin-film absorber layer
(e.g. CIS, CIGS, CdTe) in thin-film photovoltaic cells
Optimise electrical conductivity through layer
thickness analysis

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