Atomic Layer Deposition (ALD)

Atomic Layer Deposition

Atomic layer deposition (ALD) is a true "nano" technology, allowing ultra-thin films of a few nanometres to be deposited in a precisely controlled way. The two defining characteristics of ALD - self-limiting atomic layer-by-layer growth and highly conformal coating offer many benefits in semiconductor engineering, MEMS and other nanotechnology applications.

The benefits of ALD

  • Because the ALD process deposits precisely one atomic layer in each cycle, complete control over the deposition process is obtained at the nanometre scale
  • Conformal coating can be achieved even in high aspect ratio and complex structures
  • Pin-hole and particle free deposition is achieved

A very wide variety of materials is possible with ALD:

Oxides, including HfO2, HfSiO, Al2O3, Ta2O5, TiO2, La2O3, SiO2, ZnO
Nitrides, including TiN, TaN, AlN, SiNx, HfN
Metals, including Ru, Cu, W, Mo

  • ALD Cycle 
  • Applications 
  • Remote Plasma 
  • System Features 
  •  

The ALD Cycle:

 TMA    TMA Dose TMA Purge 
1.  TMA Dose 2. TMA Purge  3. O2 Plasma  4. Short post plasma purge
ALD cycle for Al2O3 deposited using TMA and O2 plasma6. Only step 3 varies between H2O for the thermal process or O2 plasma.

Many ALD Applications including:

  • High-k gate oxides
  • Storage capacitor dielectrics
  • Pinhole-free passivation layers for OLEDs
    and polymers
  • Passivation of crystal silicon solar cells
  • High aspect ratio diffusion barriers for Cu interconnects
  • Adhesion layers
  • Organic semiconductors
  • Highly conformal coatings for microfluidic and MEMS applications
  • Other nanotechnology and nano-electronic applications
  • Coating of nanoporous structures
  • Fuel cells, e.g. single metal coating for catalyst layers
  • Bio MEMS

The benefits of remote plasma Atomic Layer Deposition

In addition to the benefits of thermal ALD, remote plasma allows for a wider choice of precursor chemistry with enhanced film quality:

  • Plasma enables low-temperature ALD processes and the remote source maintains low plasma damage
  • Effective metal chemistry through use of hydrogen plasma rather than complex thermal precursors
  • Eliminates the need for water as a precursor, reducing purge times between ALD cycles - especially for low temperatures.
  • Higher quality films through improved removal of impurities, leading to lower resistivity, higher density, etc.
  • Ability to control stoichiometry
  • Plasma surface treatment
  • Plasma cleaning of chamber is possible for some materials

ALD Tools from Oxford Instruments  

 Feature  OpAL™  FlexAL ®
Substrates Up to 200mm wafers & pieces directly on stage Up to 200mm wafers handling and pieces on a carrier plate
Bubbled liquid & solid precursors Up to 3 Up to 4
Max precursor source temperature 200ºC (Jacket) 200ºC (Oven & jacket)
Wafer delivery (inc source pot) Included Included
Mfc controlled gas lines with rapid delivery system;
1) thermal gas precursors (e.g. NH3, O2)
2) plasma gases (e.g. O2, N2, H2)
2 internally.
Up to 8 in externally
mounted gas pod
Up to 10 in externally mounted gas pod
Plasma Option/field upgrade Option
 Loading Open load Loadlock or cassette
Clusterable to other process modules No Yes - inc third party MESC modules as special option
Wafer stage temperature range

25ºC – 400ºC

25ºC – 400ºC (550ºC option)

Ellipsometry ports Yes Yes
Swagelok 10ms rapid pulsing ALD valves Yes Yes

 

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