Ni Etching - Nickel Etch

  • Plasma 
  • Ion Beam 
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  •  
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Inductively coupled plasma sources

Redeposition-free ICP Nickel Etch
0.5µm deep, PR removed

 Ni Etch

OPT application lab:1.4 µm Ni etch (PR Mask intact)

  • ICP 65 for up to 2” wafers
  • ICP 180 for up to 100mm wafers
  • ICP 380 for up to 200mm wafers
    Smaller wafer pieces may also be etched in each system.
  • ICP etching with RIE-biased and temperature-controlled wafer electrode
  • Argon sputter based process

 

Results:

  • Depth: >0.5µm
  • Etch Rate : >30nm/ min
  • Uniformity (single wafer 4"/ 6") < +/- 4 /5  %
  • Uniformity in "RIE" (12 wafer batch) < +/- 7 %
  • Uniformity in "RIE" or "ICP"
  • Selectivity over PR mask   >0.3:1
  • Selectivity to PR mask   ca 1 : 1 in "RIE"
  • Profile:     >70º
  • Redeposition: can be avoided
  • Ni >   8 nm/ min ("RIE" by Ar sputter etching)
     

Nickel (Ni) Ion Beam Etching (IBE)

 0.3 µm deep Ni etch
PR mask not removed

Process Specification

  • Ni IBE in the Ionfab300Plus (LC)
  • Process gas: Ar
  • Up to 200mm wafers
  • Summary performance data:

 Chamber base pressurea  <4e-7 Torr
 Load lock base pressureb  <2E-5 Torr

a. After 12 hours bake out at 80˚C
b. Load lock pumps down to 6E-5Torr in less than three minutes. It takes less than five minutes from  sample loading i.e. from the load lock to process platen with load lock pump down sequence.

Notes:  

  • Regular cleaning and conditioning of the chamber is required. This may occasionally involve a mechanical clean of the chamber.
  • Some variation in etch rate, selectivity and profile will be observed between wide features and narrow features.
  • Etch rate, profile, and selectivity data given above applies to wide features. Mask is PR unless otherwise stated
  • Profiles quoted require original mask profile to be >85°
    Standard definitions of uniformity given below:

Within wafer uniformity is measured in a five point pattern:

Click here for uniformity

 Click for uniformity

Process specification

1. Ni etch with rotation and adjustable tilt. 

 Parameter/Process  Ni etch
 Diameter etched  200 mm
 Mask  SiO2
 Gas chemistry  Ar
 Typical etch rate [nm/min]  20nm/min
 Uniformity [±%]3  <3
 Reproducibility [±%]  <3
 Selectivity to mask  0.81

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