Our customers benefit from our process guarantees: controllable, repeatable processes developed in our own applications laboratory and backed by onsite process acceptance and support.
- Up to 200 mm wafer with typical uniformity <±2%
- Provides excellent step coverage even inside high aspect ratio structures
- Offers superb thin film barrier properties
- Low carbon contamination of Al2O3 (AES)
- Amorphous, pin-hole free Al2O3 (TEM)
- Excellent uniformity of HfO2, < ±2% on a 200 mm wafer (Spectroscopic Ellipsometry)