Application Note LibraryEnergy Dispersive Microanalysis (EDS/EDX), Wavelength Dispersive Microanalysis (WDS) and Electron Backscatter Diffraction (EBSD) for electron and ion-beam microscopes.

  • EDS systems characterise elemental and/or chemical composition
  • WDS does so with greater resolution and precision
  • EBSD delivers microstructural characterisation in the SEM/FIB
  • Application-specific modules are also available that have been tuned to process-driven tasks such as Gunshot Residue Analysis and Mineral Liberation Analysis - or for extended analyses, such as multi-layer characterisation and thickness measurements