Energy Dispersive Microanalysis (EDS/EDX), Wavelength Dispersive Microanalysis (WDS) and Electron Backscatter Diffraction (EBSD) for electron and ion-beam microscopes.

  • EDS systems characterise elemental and/or chemical composition
    • WDS does so with greater resolution and precision
  • EBSD delivers microstructural characterisation in the SEM/FIB
  • Application-specific modules are also available that have been tuned to process-driven tasks such as Gunshot Residue Analysis and Mineral Liberation Analysis - or for extended analyses, such as multi-layer characterisation and thickness measurements
Application Note Library Click to listen to the In-Situ EBSD Webinar offline!



 

Measure Both Elastic & Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode http://t.co/Gsc5auGUhu
9:22 AM - 27 Aug 14
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