X-Max Large Area Analytical EDS SDD

X-Max Large Area SDDs offer the benefits of a silicon drift detector (SDD):

• LN2-free analysis

• Speed
• Increased counts
• Reduced analysis times

Combined with the benefits of an Oxford Instruments EDS detector:

• Accuracy
• Guaranteed specifications
• The world-renowned INCAEnergy EDS software
• 35 years of experience backing you up

•

• Unique single sensor large area SDD sensors
• Up to 80mm² active area
• Count rates > 500,000 cps
• Throughput > 200,000 cps
• MnKα typically 125eV
• Optimised electron trap
• Vacuum enclosed sensor to reduce oxygen absorption
• Only one pulse processing channel required
• Standard tube diameter (no larger than that of a 10mm2 SDD detector)
• Motorised slide as standard
• Pile up correction software for accurate analysis at high count rates

Why are large area detectors good for analysis?

As the detector sensor size increases, so the number of counts it can capture increases as well.  Traditionally, restrictions on the manufacturing process have meant that single SDD sensor sizes were limited to less than 40mm² active area but now with X-Max, the active area has been doubled.

What this increase in active area means for you:

• Up to 10 times higher count rate without changing anything but your detector
• Increased productivity
• A reduction in analysis time (up to 10 times less)
• Improved accuracy under current conditions

• Higher count rates even at low beam current or low kV
• Simultaneous imaging and analysis without compromise
• Practical nano-analysis at productive count rates
• The ability to analyse beam sensitive or biological samples

The large solid angle and ability to perform high count rate EDS analysis at a fraction of the beam currents used by traditional 10mm² SDD detectors means the new 80mm² X-Max opens a whole new world of analysis for electron microscopists looking to characterise beam sensitive materials or biological samples. 

NanoAnalysis

To analyse very small particles in a matrix, it is often necessary to reduce the accelerating voltage and beam current to minimise the interaction volume excited by the beam.  However, minimising the interaction volume means that the number of X-rays excited falls drastically as well. In the past, the only way of collecting enough data to analyse was either to compromise between the quality of the image and the number of  counts available for analysis or to lengthen the counting time. 

With X-Max's large active area, though, nanoanalysis has become much easier.  This image shows a map of a nickel sample containing very small boron and carbon precipitates.  It was mapped at 5kV and 13,000cps for just 90 minutes and clearly shows that even under these limiting conditions, particles of less than 30nm can be clearly and easily mapped. 

High Count Rate Mapping

One of the key advantages of SDD over the more traditional Si(Li) detectors is their ability to perform analysis at very high count rates.  X-Max has very high throughput capabilities which allows maps to be collected in seconds.  The figure shows a map collected on a granite surface.  It was taken at 20kV, 400kcps, for 60 seconds (1 minute).

X-Max shows excellent light element performance at all sizes with resolution guaranteed in accordance with ISO15632:2002.  ISO15632:2002 is a professional standard for EDS manufacturers.  It gives guidelines on how to measure resolution and evaluate the performance of a detector at all energies.

X-Max has a typical carbon resolution of 56eV.

An example of the light element performance can be seen in the image.