New HKLNordlysNano detector

New NordlysNano is 60% more sensitive

Get 60% more sensitivity with the new Oxford Instruments EBSD detector.

Oxford Instruments NanoAnalysis, a world leader in microanalysis systems, launched a new EBSD detector at M&M 2011. 

The NordlysNano detector has been redesigned to address the growing requirements of nanoscale applications. EBSPs are now imaged with 60% more sensitivity, lowest optical distortion and highest resolution.

Collect and solve the best quality patterns in real-time at low beam currents and at low kV.

New NordlysNano delivers:

  • Highest sensitivity at the fastest possible speeds - minimise the time and the beam current required for data collection
  • Best low kV analysis, required for:
    • Nano materials, where low kV offers better spatial resolution
    • Beam sensitive samples, where higher beam energies and beam currents can damage the sample
    • Insulators, where using low kV and low beam current can reduce charging and remove the need to coat the sample
  • Better Pattern Quality
    • See real sample detail by collecting the best possible patterns

 


  • Applications 
  • Press Release 
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NanoCrystalline Material
Higher spatial resolution requires low kV analysis. The example of nanocrystalline nickel displays small grains, in the order of  0.5μm, surrounded by much larger grains.

Raw data shown with 92% hit rate at 101Hz. Beam conditions 2nA at 5kV.

    Nanocrystalline Nickel

Insulating Material
In this alumina sample there was excessive charging at 10kV. At 5kV charging was minimised.

The EBSD map was acquired at 5kV, 80Hz and 85% hit rate.*


* Hit rate limited by the porosity of the sample and the presence of a glassy amorphous phase.

    Alumina image at 10kV, map at 5kV
EBSD at Low Beam Current
For certain samples or SEM types low beam current work is most suitable. With NordlysNano EBSD maps are possible at low beam currents, at the fastest possible speeds.
    IPF map
 
Release Date:  August 8th 2011

 

Get 60% more sensitivity with NordlysNano, the new Oxford Instruments EBSD detector

Oxford Instruments NanoAnalysis, a world leader in microanalysis systems, has launched a new EBSD detector at M&M 2011.  The new NordlysNano addresses the growing requirements of nanoscale applications: it is 60% more sensitive than the previous generation of EBSD detector, the NordlysS. 

Increased sensitivity offers a number of benefits. Firstly, accurate EBSD data can be collected at lower beam energy, including low beam currents (<0.1nA) and low kV.  Using lower energy beams is essential for applications where spatial resolution is required, for example nanoscale applications.  It is also important when looking at beam sensitive samples, or non conducting samples.  In addition, increased sensitivity enables faster data acquisition under comparable beam conditions. 

According to EBSD Business Manager, Dr. Jenny Goulden, “As a business, Oxford Instruments aims to use innovation to turn smart science into world class products that delight our customers, and the NordlysNano is a classic example of achieving  just that!”.

The new detector will be demonstrated at M&M 2011 in Nashville, August 7th – 11th.

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