X-Max
The X-Max Silicon Drift Detector (SDD) offers users over TEN times the solid angle of conventional EDS detectors - without compromising on performance. Now you can have count rate, imaging, and analytical performance all at the same time.
X-Max comes in 3 different active area sizes: 20mm², 50mm², and a staggering 80mm². Its performance has now been upgraded to offer the best combination of size, speed and resolution performance available.
Features
- Up to 80mm² active area
- Count rates > 500,000 cps
- Throughput > 200,000 cps
- MnKα guaranteed @ 124eV, CKα guaranteed @ 48eV (on your column)
- Optimised electron trap
- Vacuum enclosed sensor to reduce oxygen absorption
- Only one pulse processing channel required
- Standard tube diameter (no larger than that of a 10mm² SDD detector)
- Motorised slide as standard
Benefits
X-Max Large Area SDD is a unique silicon drift detector (SDD) with:
- Proven accuracy at high count rates - AutoID and quant are correct at 200,000cps
- The best sensitivity for light element analysis - combines largest area with best resolution
- The performance needed for analysing smaller nanostructures - maximises X-ray collection under fine probe conditions
- The capability to analyse the most difficult samples - minimises sample damage and contamination
- AZtec unleashes the X-Max capability to provide the fastest, most accurate analysis available today.
Why are large area detectors good for analysis?
As the detector sensor size increases, so the number of counts it can capture increases as well. Traditionally, restrictions on the manufacturing process have meant that single SDD sensor sizes were limited to less than 40mm² active area but now with X-Max, the active area has been doubled.
What this increase in active area means for you:
- Up to 10 times higher count rate without changing anything but your detector.
- X-Max shows excellent light element performance at all sizes with resolution guaranteed in accordance with ISO15632:2002. ISO15632:2002 is a professional standard for EDS manufacturers. It gives guidelines on how to measure resolution and evaluate the performance of a detector at all energies.
- Increased productivity and a reduction in analysis time (up to10 times less)
- Improved accuracy under current conditions
- Higher count rates even at low beam current or low kV
- Simultaneous imaging and analysis without compromise
- Practical nanoanalysis at productive count rates
- The large solid angle and ability to perform high count rate EDS analysis at a fraction of the beam current used by traditional 10mm SDD detectors means the 80mm² X-Max opens a whole new world of analysis for electron microscopists looking to characterise beam sensitive materials or biological samples.