INCAEnergyTEM has been designed to accommodate the needs of TEM/STEM analysis. Detector specifications are well suited to modern Analytical TEMs with detector protection for 100kV intermediate and high voltage microscopes and almost instant recovery times when exposed to high electron flux. Software has been developed specifically to address the needs of the TEM analyst taking into account the special conditions needed for thin specimens.
- Reliable hardware that comes with a guaranteed performance <1ev shift in peak position and resolution between count rates of 1Kcps and 10Kcps.
- Reliable detector that comes with guaranteed performance - resolution guaranteed on the microscope.
- Patented conditioning circuit, that removes crystal contamination ensuring optimum performance all the time.
- Shutter for protecting against electron flux. Does not require any detector retraction which can affect high resolution imaging.
- Optimized solid angle for best count rates.
- Quantitation specific to TEM analysis. Cliff-Lorimer routine with the ability to input thickness and density parameters for absorption corrections.
- Data presentation as quantitative results, charts, line profiles etc.
- Automatic spectrum termination on a window integral for optimum detection of trace elements
- Spectrum reconstruction