Powerful EDXRF spectrometer - X-Supreme8000

Oxford Instruments’ powerful Silicon Drift Detector (SDD) and high reliability X-ray tube technologies guarantee precise multi-element analysis at concentrations from high percentage down to ppm levels of detection, covering elements Na11 to U92 in the periodic table.

Wide range of sample types, including:

• Solids
• Liquids
• Powders
• Pastes
• Films

Minimal or no sample preparation

• No weighing or volumetric measurements
• No potentially dangerous chemicals
• Non-destructive analysis

Easy loading

• 10 positions for time saving unattended operation
• Unique design guarantees high precision, consistent, repeatable results from every tray position
• Tested to 1 million cycles, fully loaded – equivalent to 15 years of operation at 200 samples per day

Rapid results

• Simultaneous single or multi-element analysis with ‘Live Updates’ – results obtained 5 seconds after measurement starts, allowing a rapid assessment to be made
• Results obtained using empirical calibrations for highest accuracy and traceability. Optional Standardless (Fundamental Parameter) Analysis where no or very few standards are available
• Rugged and reliable operation on a 24/7 basis carried out by laboratory or shift personnel day