Nanotech Capability

• INCAEnergy TEM - elemental determination at the nm scale for thinned samples.
• INCAEnergy SEM - and INCAWave - elemental determination at sub 100 nm spatial resolution for bulk samples, and quantitative composition and thickness measurements for thin films at the nm scale (SEM).

These techniques are extensively used for the characterisation of a wide variety of nano-applications including novel nano-catalysts, high temperature superconductors, optoelectronic devices and advanced nano-composites for aerospace.

• INCACrystal and HKL Channel 5 - determination of the crystal phase, texture and grain orientation at features for features down to approximately 10 nm (SEM).  This technique is utilised, for example, in the characterisation of semiconductor interconnects, high performance ceramics and advanced alloys.
• INCA Feature - automated location and characterisation of morphology and composition of nanoscale features (SEM). This technique is utilised, for example, in the classification and characterisation of high performance ceramics, advanced alloys and nano materials.