Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

  Go

Please click here if you would like additional information

Steel Inclusion analysis with INCASteel

INCASteel : Microanalysis System Solution for the location and analysis of steel inclusions

The use of speciality steels in industry is becoming increasingly widespread. These steels have improved mechanical behaviour. An important controlling factor for this superior behaviour is the 'cleanliness' of the steel, a measure of the amount and type of small non-metallic inclusions. INCASteel is a dedicated package developed specifically for the analysis and classification of steel inclusions, using energy dispersive X-ray microanalysis (EDS) in the scanning electron microscope (SEM). INCASteel offers a fast and powerful solution for the location and analysis of steel inclusions, giving results that comply with any of the four published standard methods - ASTM E2142, SS111116, DIN 50602 and ISO 4967.

Standard Features

INCASteel consists of INCAFeature and Inclusion Classifier. INCAFeature is used to detect, measure and analyse the inclusions in the steel. Inclusion Classifier processes the resulting data set to the published standard methods and includes functionality to plot complex ternary diagrams.

here...

Product finder

All products: A-Z

or

or

Sales & Service Contacts


Sales Service

Downloads and Links

    Related Information

    Related Products