Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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The new X-MET5000 for ore exploration and on-site excavation control in mines

X-MET5000 for analysis of ores

X-MET5000 for ore exploration and on-site excavation control

Oxford Instruments launches a rugged new hand-held XRF analyser for demanding on-site ore exploration in mines

Oxford Instruments announces the launch of a new, robust X-Ray Fluorescence (XRF) analyzer – the X-MET5000, for the accurate and reliable identification of multi-element ores.  The X-MET5000 represents the 4th generation of Oxford Instruments’ hand-held analyzers.

This design experience combined with Oxford Instruments’ patented PentaFET® detector technology guarantees fast analysis and lower detection limits for all elements of interest for on-site analysis in mines. 

The X-MET5000 can measure directly on drill cores or the sample can be prepared for a more accurate analysis.  Multi-element ores can be reliably analyzed.  The user friendly empirical calibration package allows on-the-spot sample analysis and the universal fundamental parameter analysis mode is available for measurement of ores without known standards.  With results often obtained in even less than 20 seconds – the powerful user programmable interface enables highly accurate screening for on-site Go/No-Go decisions. 

This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection.  The X-MET5000 is perfect for the harsh conditions of a mine.  The battery’s operating time of one working day enables extended productivity without returning to base. 

An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.

 



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