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The new X-MET5000 for Compliance screening of all materials with one single unit
(RoHS • WEEE • ELV• Pb-free • Hi-Reliablity systems • Packaging)
Oxford Instruments announces the launch of a new, robust X-Ray Fluorescence (XRF) analyzer –the X-MET5000, for accurate and reliable identification of elements regulated by compliance legislation. The X-MET 5000 represents the 4th generation of Oxford Instruments’ hand-held analyzers.
This design experience combined with Oxford Instruments’ patented PentaFET® detector technology guarantees fast analysis and lower detection limits for all elements of interest.
The X-MET5000 analyzer provides rapid, non-destructive, point and shoot compliance screening of plastics, PCBs, cables, plastic housings, solder material, fasteners, sheet metal, and other electronic components.
RoHS regulations restrict the presence of Pb, Hg, Cd, Cr6+ and PBB & PBDE (Br compounds) in electrical and electronic equipment. These regulations impact the manufacturers of electronic goods and supply chains worldwide and require testing of all materials, components and parts used in electronic equipments. The X-MET5000 conforms to IEC Method 62321 and effectively tests for regulated substances at the compliance levels for all restricted elements.
Industries with high reliability exempt applications, like aerospace, medical equipment and military systems can use X-MET5000 to ensure the presence of adequate lead in their product components, especially in finishes and solder joints for reasons of product safety and reliability. The X-MET5000 can also sort PVC and Br or Sb containing plastics in seconds and helps to support the Waste Electrical and Electronic Equipment (WEEE) recycling.
The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically chooses the best analysis method.
An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.
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