New rugged X-MET5000 analyzer for fast and accurate analysis of valuable and unwanted elements in metal scrap

Oxford Instruments announces the launch of a new, robust X-Ray Fluorescence (XRF) analyzer – the X-MET5000, for accurate and reliable identification of metal alloys.  The X-MET 5000 represents the 4th generation of Oxford Instruments’ hand-held analyzers. 

This design experience combined with Oxford Instruments’ patented PentaFET® detector technology guarantees fast analysis and lower detection limits for all elements of interest.

The current high prices of commodities metal, in particular Nickel, make the accurate determination of alloy composition critical in the financial success of modern recycling operations.  The X-MET5000 quickly and accurately measures Nickel even in concentrations below 1%.  The same instrument can be loaded with both a metals analysis program and plastic analysis program making it ideal for the growing scope of recycling industry.  An analytical program for precious metals analysis is also available. 

The X-MET5000’s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of the matrix elements even when the sample contains light elements like Aluminum and Silicon. This is not possible when using Fundamental Parameters (FP) on an analyzer that does not detect the light elements.

This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection.  The X-MET5000 is perfect for the harsh conditions of a scrap yard. The battery’s operating time is one working day and enables extended productivity in the yard.

An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.