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X-Strata960 - For measurement of coating thickness and material composition.
An XRF analyzer for measurement of coating thickness and material composition.
- Measure the thickness and/or composition of plating, coatings, and films, containing elements from Ti through U
- 5 layers / 15 elements / Common elements correction
- Composition analysis of up to 15 elements simultaneously
- Measurement method according to ISO 3497, ASTM B568 and DIN 50987
Additional Key Features
- Fast and accurate
- Superior performance - highest degree of confidence in results and maximum throughput.
- Distance independent mode for measurement in recesses or odd shaped samples with one calibration.
- Easy operation
- Automatic spectrum calibration
- Small spot size
- Largest measurabale sample area
- Distance independent measurement (option)
- Auto range finder laser focus (option)
- Advanced data export (option)
- Integrated PC and monitor
- Add unlimited number of applications in the future at no additional cost
Product finder
Sales & Service Contacts
Downloads and Links
- X-Strata960 brochure
(2.2 Mb)
- X-Strata960 brochure in French
- X-Strata960+ Gold flyer
(760 Kb)
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