Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015
05 May 2015

Oxford Instruments Asylum Research in conjunction with the Materials Research Society (MRS) will host the webinar “Beyond Topography: New Advances in AFM Characterization of Polymers”, May 28, 2015 at 11:00am EDT. Presenters include Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader, and Anna Kepas-Suwara, Sr. Materials Scientist, of Tun Abdul Rezak Research Centre (TARRC). This webinar will provide an overview of the AFM’s powerful capabilities for polymers characterization and will cover AFM methods for fast topographic imaging, even in liquids and at high temperatures; recent advances in viscoelastic measurements; nanomechanical mapping of rubber blends, and AFM techniques to probe electrical and functional behavior.

“Whether investigating fundamental research principles or engineering a specific product, AFM is a important tool for evaluating polymers and polymer blends,” said Ben Ohler, Director of Marketing at Asylum Research. “Though a great deal can still be learned from basic topographic and phase imaging with AFM, recent advances in technology have led to significant advances in characterizing nanoscale mechanical properties (storage modulus and loss tangent), operating in controlled environments (e.g. temperature control or solvents), and high speed imaging of dynamic processes.

This webinar will be educational for scientists in academia and industry who want to learn more about the latest applications of AFM to polymer science.” Registration for the webinar can be found here.

Figure caption: The bulk properties of polymer blends are determined by the amount, distribution, and properties of their components. This sample is a blend of natural rubber, polybutadiene rubber, and zinc oxide. The elastic response distinguishes all three materials, but the zinc oxide inclusions (circles) stand out more clearly by their much lower loss tangent, 5 μm scan. Images courtesy of Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre, UK.

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