Oxford Instruments Industrial Analysis is now part of Hitachi High-Technologies Group.

Oxford Instruments Industrial Analysis is now part of Hitachi High-Technologies Group.

Are Your Overplating Costs Adding Up Significantly?

Where Every Mil and Micron Counts

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Learn How Easy it is to Control Your process to Specification and Not Waste Money

Oxford Instruments has the widest range of both XRF and eddy mag equipment that can satisfy your coating/plating needs

  • SPEED OF ANALYSIS: XRF elemental analysis and coating thickness results in as little as 10 seconds from 1 up to 4 layers. Eddy Mag coating analysis in about 1 second. 
  • EASY TO USE: The X-Strata and CMI instruments can be used by production staff and requires minimal training or expertise
  • SAMPLE POSITION: The X-Strata has a clear high-resolution pin-point analysis video camera with high-magnification. X, Y, Z table it can even be pre-programmed to run pin-point analysis even without an operator present. With the CMI instruments you simply touch the probe tip to the measurement area.
  • ADVANCED SECURITY: The X-Strata autolock function prevents unauthorized use and limited features can be programmed for routine operators.
  • CALIBRATIONS: The X-Strata uses both fundamental and empirical calibration methods for highest accuracy of analysis and these can be created in a matter of minutes. The X-Strata complies with ASTM and ISO standards for coating thickness measurement using X-Ray spectrometry methods. 
  • ROBUST: Both types of instruments are sturdy and industrial design make it ideal for either the laboratory or production line. 
  • REPORTING: Results can be exported into MicroSoft Excel for customized reporting
  • SERVICE: A dedicated service support team/short service times.
  • EXPERIENCE:  We have over 25 years experience manufacturing coating thickness analyzers

X-Strata920 Helps to Reduce Plating Costs

X-Strata XRF provides cost-effective, rapid and reliable measurement of coating thickness and materials anaysisx-strata920-benchtop-coating-thickness-xrf-analyser_jpg.jpg

  • 100% non destructive testing
  • No operator-to-operator variability
  • Clear pin-point analysis
  • Results within seconds
  • No sample preparation required

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