Learn how AFM can improve thin film development and process control

 

Topics include:

 

  • Using morphology to help develop and monitor thin film deposition conditions

  • Measuring mechanical properties (e.g. elastic and loss moduli) at the nanoscale

  • Understanding how temperature and solvent exposure can affect thin films

  • Correlating thin film functionality to nanoscale electrical and electromechanical properties

 

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AR is in booth #510 this week at the #MRSFall2016 demonstrating our new electrochemistry cell for the Cypher ES Ato… https://t.co/km2P7pbMe7
10:23 PM - 29 Nov 16
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