Learn how AFM can improve thin film development and process control


Topics include:


  • Using morphology to help develop and monitor thin film deposition conditions

  • Measuring mechanical properties (e.g. elastic and loss moduli) at the nanoscale

  • Understanding how temperature and solvent exposure can affect thin films

  • Correlating thin film functionality to nanoscale electrical and electromechanical properties


Get Application Note 

Have a drink on us at the French SPM meeting next week. Julien Lopez and Raphael Barbattini. Email julien.lopez@oxi… https://t.co/Nb7PfQHFPz
10:02 PM - 16 Mar 18
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