The Atomic Force Microscope (AFM) is a powerful microscopy technique which can take nano-scale images on a variety of surfaces. Much like a record player, the AFM uses a stylus or cantilever to physically touch the surface. Many of the AFM cantilevers have a sharp point that is on order of a few nanometers wide, which allows it to probe very small features. Unlike many ultramicroscopy techniques such as electron microscopy, the AFM does not need to be operated in a vacuum; in fact, it can even be used on samples completely immersed in water or other liquids. In addition to making three-dimensional (3D) nano-scale images of surfaces, the AFM cantilever can be used to measure magnetic fields, electrical fields, and current flow on a sample. Last, because the AFM physically touches the sample, measurements of physical properties such as adhesion, single molecule binding, single molecule unfolding, and mechanical properties such as modulus, loss tangent, piezo force, and stiffness can be made in a variety of environemnts. Due to its flexibility to operate in a variety of modes and environments, AFM is easily combined with other techniques such as optical microscopy and fluorescence spectroscopy.

Bimodal Dual AC Mode

An exclusive new measurement ability, Dual AC, has been developed by Asylum Research for use on the MFP-3D™ and Cypher™ AFMs. Since its introduction, the number of applications for Dual AC has increased dramatically. This note will give you an introduction to bimodal imaging, just one of many Dual AC techniques that can be performed on Asylum's AFMs.

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Measuring Surface Roughness with Atomic Force Microscopy

Surface roughness at the nanoscale and below plays a crucial role in determining the functional performance of many devices. Understanding and characterizing nanoscale and even sub-angstrom roughness is becoming increasingly important in our ability to continue exploring and building devices at ever smaller length scales.

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Automating Your Asylum Research AFM with the MacroBuilder Interface
Asylum Research provides full-function MFP-3D™ and Cypher™ Atomic Force Microscopes (AFMs) with superior capabilities that require no programming to perform advanced imaging and measurements. For more advanced, automated, and custom experiments, Asylum also provides a user-driven programming language called IGOR Pro. The MacroBuilder™ interface allows you to easily set up and run a sequence of measurements unattended while automatically varying parameters – and without writing any code. The MacroBuilder interface is provided as a standard capability on all MFP-3D and Cypher AFMs. 
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Digital Access Module Controller Accessory
The Digital Access Module is an optional hardware accessory for the MFP-3D™ Controller that allows user access to the digital operations of the controller. The Digital Access Module enables applications such as photon counting, synchronization of user experiments to the AFM scan, and general purpose digital I/O control.
PDF 483KB

Asylum's AFM Workshop and Open Lab is coming to Purdue Univ. May 8-10. See the first and only full-featured video-r… https://t.co/afJgHnqlwv
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