ORCA Conductive AFM

ORCA™ provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges and Dual Gain versions are available. Electrical Tools Application Note

High Voltage Piezoresponse Force Microscopy (PFM)

The HV-PFM option enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers. PFM Application Note 

Electrochemistry Cell

The Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder and standard electrodes. Users may choose their own potentiostat. The EC Cell is glovebox compatible. Available only for the Cypher ES. Electrochemistry Data Sheet

Electrochemical Strain Microscopy (ESM)

ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. ESM Application Note

Scanning Tunnelling Microscopy (STM)

STM can be useful for high resolution imaging of conductive samples in solids with unprecedented resolution.

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to +150 V can be applied while monitoring current through a conductive AFM probe. Electrical Tools Application Note

Scanning Microwave Impedance Microscopy (sMIM)

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors and insulators. Not available on Cypher ES. sMIM Application Note


Have a drink on us at the French SPM meeting next week. Julien Lopez and Raphael Barbattini. Email julien.lopez@oxi… https://t.co/Nb7PfQHFPz
10:02 PM - 16 Mar 18
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