Advanced Techniques for Measuring Nanoelectrical and Nanomechanical Properties: Materials and Life Sciences
The aim of the workshop is to enhance the knowledge and experience of the local atomic force microscopy (AFM) user community. The workshop is ideal for those that have some AFM experience and would like to elevate their skills for use in their own research.
• Measuring nanomechanical and nanoelectrical properties
• Sample preparation
• Mitigating image artifacts
• Data analysis and interpretation
Afternoons: Equipment demonstrations
Expert AFM users demonstrate sample preparation and tips and tricks on imaging techniques, using Asylum Research MFP-3D-BIO AFM and Cypher AFM. Students have an opportunity to engage in group discussions with the instructor and their peers.
Dr. Emily Cranston, Assistant Professor, McMaster University
Dr. Peter Grutter, Chair, Dept. of Physics, McGill University
Donald McGillivray, Graduate Teaching Assistant, University of Waterloo
Jason Wang, Research Engineer, University of New Brunswick
Sophia Hohlbauch, Applications Scientist, Oxford Instruments Asylum Research
Keith Jones, Applications Scientist, Oxford Instruments Asylum Research
Rob Cain, US Technical Sales Manager, Oxford Instruments Asylum Research
All attendees are encouraged to bring a poster for the poster reception. Prizes will be awarded for the best poster.
Registration is $50 and includes all lunches, breaks and evening happy poster session happy hour.
Ernest Rutherford Physics Building, Room 103 (Bell Room)
3600 Rue University
Montreal, QC H3A 2T8 Canada
Nushaw Ghofranian, Oxford Instruments Asylum Research
McGill University, Department of Physics
Oxford Instruments, Asylum Research
McGill Summer School AFM Workshop Program