ORCA Conductive AFM

ORCA™ provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges and Dual Gain versions are available. ORCA CAFM Application Note, Electrical Tools Application Note

High Voltage Piezoresponse Force Microscopy (PFM)

The Piezo Force Module enables operation at high tip biases up to + 220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. (up to +150 V on MFP-3D Infinity). PFM Application Note 

Electrochemical Strain Microscopy (ESM)

ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.

Scanning Tunnelling Microscopy (STM)

STM can be useful for high resolution imaging of conductive samples in solids with unprecedented resolution.

Electrochemistry Cell

The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials.  The cell can be operated in a fully sealed configuration and maybe equipped for heating up to 60°C. Electrochemistry Cell Data Sheet

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to +220 V can be applied while monitoring current through a conductive AFM probe. Electrical Tools Application Note

Scanning Microwave Impedance Microscopy (sMIM)

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors and insulators. sMIM Application Note