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"Exploring Flatlands:  Characterizing 2D Materials with Atomic Force Microscopy (AFM) " 

December 13th, 2016: Ideal for researchers in both academia and industry, this webinar discusses the powerful techniques of today’s AFMs for characterizing 2D materials that enable higher resolution, greater sensitivity, and more quantitative results for applications in device manufacturing, energy storage and optoelectronics.


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Featured webinars from our archives

"How to Choose the Right AFM Probe" 
Recorded live on September 8th, 2016

For consistently successful results, AFM probe selection is key to your AFM research. How do you choose from all the possible probes, scan modes, and scanning conditions? Please join us to learn tips and tricks from AFM experts.

"Thanks. The webinar [How to Choose the Right AFM Probe] was very clear and nice! We're looking forward to watching the recorded version to take advantage of all the info and suggestions". — Univ. of Technology Eindhoven

Watch the Recorded Webinar Now!

 

"More than Just Roughness: AFM Techniques for Thin Film Analysis"
 Recorded live on June 1st, 2016

Thin films and coatings are critical in everything from common consumer products to next-generation photovoltaics and data storage. Regardless of application, enhanced film performance is increasingly achieved by controlling and manipulating materials on micro and nanometer length scales. Thus the need to measure film structure and properties on similar scales has grown correspondingly important.

In this webinar, we explore the powerful capabilities of today’s atomic force microscopes (AFMs) for characterizing thin films. For example, the AFM is well known for its high-resolution topographic imaging capabilities. But recent improvements in speed, sensitivity, and ease of use make it more valuable than ever for quantifying 3D roughness and texture. We cover the basic concepts of surface imaging and analysis, and show illustrative examples.
 
Research and instrumentation advances have also produced a variety of AFM techniques to characterize electrical, electromechanical, and other functional response. We overview these techniques and discuss in detail an example of their application to memory access devices in the semiconductor industry. New capabilities for nanomechanical imaging are also briefly introduced.
 
With examples that cover a wide range of systems, this webinar highlights the impact and versatility of advanced AFMs for thin-film research and development.
 
 
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