"Piezoresponse Force Microscopy: From Theory to Advanced Applications"

This two-part webinar series was first presented live on May 4 and May 6, 2015

 

Electromechanical coupling is one of the fundamental mechanisms underlying the functionality of many materials. These include inorganic macro-molecular materials, such as piezo- and ferroelectrics, as well as many biological systems. Necessity for probing electromechanical functionalities has led to the development of Piezoresponse Force Microscopy (PFM), an ideal tool for local nanoscale imaging, spectroscopy, and manipulation of piezoelectric and ferroelectric materials.

Join us for this informative webinar series that will be presented in two parts. The first in the series is an “Introduction to PFM” while the second webinar will cover “Advanced PFM Techniques”. Presenters include PFM pioneers Dr. Sergei V. Kalinin, Director at the Institute for Functional Imaging of Materials and Theme Leader at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, and Asylum Research President and co-founder, Dr. Roger Proksch.

Image: Single Frequency PFM scan of PZT made at 20 Hz with a Pt coated AC240 Electrilever. The piezoresponse amplitude was overlaid (color) on top of the rendered topography. Domains are visible as regions of nearly constant amplitude, 7.5 µm scan. Imaged with the Cypher AFM.


“Introduction to PFM”

View the recorded version

Topics include:
  • Basic theory of PFM
  • Electromechanical coupling
  • Limitations of conventional methodologies and advances in instrumentation to overcome these limitations including:
  • Switching Spectroscopy PFM
  • Dual AC™ Resonance Tracking (DART)
  • Band Excitation (for measuring a more complete frequency response)
This webinar is ideal for researchers who are either new to PFM or who perhaps haven’t heard about the full spectrum of existing PFM capabilities.
 

“Advanced PFM Techniques”


Topics include:
  • Band Excitation 
  • Multidimensional PFM spectroscopy
  • Electrochemical Strain Microscopy (ESM)
  • Challenges and progress in obtaining accurate d33 measurements
Advanced application examples will be presented from the CNMS user program and Asylum Research.
 
Images: Pulsed laser deposited BFO / SRO / STO film. Piezoresponse force microscopy (PFM) phase image shows the local domain structure (top) and the current map (bottom).

 


About Your Lecturers 

Dr. Sergei V. Kalinin is the Director at the Institute for Functional Imaging of Materials and Theme Leader at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory. Dr. Kalinin has published ~400 scientific papers, is a co-inventor on more than 10 patents, and has received numerous awards and honors for his research. He received is Ph.D. in Materials Science in 2002 from the University of Pennsylvania. His research interests are focused on the scanning probe microscopy of electromechanical, ferroelectric, and electrochemical phenomena, and development of big data, deep data, and smart data approaches in imaging for design of new energy and information technology materials.

Dr. Roger Proksch is President and co-founder of Asylum Research, an Oxford Instruments company. Dr. Proksch has co-authored numerous papers, is a co-inventor on more 20 than AFM patents and has been an invited speaker on advanced AFM techniques at scientific conferences. He received his Ph.D. in Physics from the University of Minnesota. 


All PFM registrants will receive a free PFM poster for their lab.



 

 

 

 

 

 

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