Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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Find us @ #SEMICONWest booth #7309.Speak to our experts Mark Dineen & Owain Thomas about our Atomic Scale Processin… https://t.co/4DBQhB4ikC
10:58 AM - 28 Jun 17
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