In this webinar Manchester University and Oxford Instruments will show how the latest FEG-SEMs and analysis technology makes EDS and EBSD characterisation at the sub 20 nm scale possible.
The speakers will present revolutionary new technology and demonstrate high spatial resolution analysis that currently requires TEM.
The webinar will appeal to anyone:
Wanting to characterise sub 20 nm structures in the FEG-SEM
With structures so small that only morphology information is achievable in their SEM
Looking to reduce routine analysis in the TEM
With an Ultra High Resolution FEG / FIB-SEM
Materials scientists interested in nano EDS / EBSD
Interested in SEM surface characterisation
Download the presentation (PDF)