Characterisation of 2D materials and heterostructures
Dr Tim Batten, Renishaw

Raman spectroscopy is a non-contact, non-destructive tool that provides sub-micrometre information on the vibrational, crystal and electronic structure of materials. It is the ideal tool for investigating 2D materials as it can be used to determine layer number, stress/strain and electronic properties. Recent advances in instrumentation at Renishaw have made characterisation of these materials easier and more comprehensive, adding features such as ultrafast mapping (>1000 spectra/s), low wavenumber filters and automatic sample focus tracking capabilities.

Here we present data highlighting some of the key capabilities of Renishaw’s inVia™ Raman microscope that make it the bestselling Raman system for understanding 2D materials. We will discuss LiveTrack™, a revolutionary Raman surface tracking technique that allows accurate Raman imaging of large, uneven samples, such as industrially grown graphene on metal foils. We also present data collected from ReS2 (a transition metal dichalcogenide) using ultra-low frequency Eclipse filters, allowing straight forward determination of the thickness of ReS2 flakes. Finally, we discuss polarisation Raman measurements that determine the orientation of ReS2 flakes, the knowledge of which is vital when constructing 2D material heterostructures.


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