Non-Contact Atomic Force Microscopy (NC-AFM 2014)
- 04 - 08 August 2014
- Businesses Attending:
The NC-AFM 2014 conference continues a series of international conferences dedicated to research at the frontiers of science and technology of non-contact atomic force microscopy and spectroscopy.
The conference covers experimental, theoretical, and instrumental contributions on frequency modulation detection mode and other dynamic and static operation modes of and atomic force microscope (AFM), with particular emphasis on high resolution imaging and force spectroscopy for a broad range of applications in nano-science, material science and technology.
A symposium devoted to Nano Mechanics for Green Innovation and Life Sciences will precede the conference.