8th International Crime Science Conference
British Library, London, United Kingdom
- 16 July 2014
- Businesses Attending:
Automated trace analysis using Scanning Electron Microscope and EDS
Automated Scanning Electron Microscopy (SEM) and compositional (EDS) analysis has long been used to analyse traces of gunshot residue obtained from suspects’ hands and clothes. For gunshot residue analysis the sample is usually collected directly onto the SEM stub. Particles down to 0.2 micrometers in size are located rapidly in the electron image and there composition and provenance confirmed using EDS analysis in a fully automated procedure. Here we review how this method can be extended to other forms of trace analysis such as the analysis of soil stemming for example from a suspects shoes or small fragments of glass. Requirements for achieving highly accurate results on a variety sample will be outlined. In particular, data interpretation and methods for comparing data from different samples will be discussed.
Dr Christian Lang - Business Manager: Solutions
I obtained an MSc in Physics from the University of Vienna, Austria and a DPhil in Materials Science from the University of Oxford. I then pursued a career in nanotechnology research in both industry and academia, working with companies like IBM, Samsung and Sharp Electronics. Four years ago I joined Oxford Instruments as a Product Manager of its Nanoanalysis Solutions Products where I now lead the development of a range of automated analysis solutions spanning a large range of applications in natural resources, steel production, the aerospace and automotive industries, semiconductor device fabrication and crime science.