University of Delaware
Interdisciplinary Science and Engineering Laboratory (ISE Lab)
221 Academy St
Newark DE. 19716
Workshop classroom 215, USA
- 31 March - 01 April 2015
- Businesses Attending:
EDS X-Ray Microanalysis in the Modern Electron Microscope
Today there is no limitation on the types of materials that are being investigated in the Electron Microscope. New improvements in microscope technology, such as low-vacuum mode, have made it common to investigate beam sensitive and non-conductive materials. Fortunately detector technology for EDS (Energy Dispersive Spectrometry X-Ray analysis), and computer software/hardware, have all advanced even faster than the modern SEM. This now allows the acquisition of meaningful analytical data under conditions not previously considered suitable for analysis.
In this workshop we will review:
new analytical hardware that allows EDS acquisition to run 100x faster than a decade ago - as well as enabling improved precision
new software options that allows
data processing while still acquiring
deconvolution of peak overlaps even while mapping
better, standardless quantitation at low kV.
There is no charge, but numbers are limited to 50 people. Please register below to resreve your place.