International Symposium for Testing and Failure Analysis

Venue:
Fort Worth Convention Center, TX, USA
Date:
06 - 10 November 2016
Businesses Attending:
NanoAnalysis
Website:
www.asminternational.org/web/istfa-2016
Dr Ziad Melhem of Oxford Instruments NanoScience will be giving a talk at MIT on the enabling technologies, require… https://t.co/MDz2SojzYv
5:21 PM - 16 Feb 18
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