Microscopy and Microanalysis (M&M 2017)

St. Louis, MO, USA
06 - 10 August 2017
Businesses Attending:
Our Stand:
www.microscopy.org/mandm/2017, explorestlouis.com/meetings-conventions/americas-c...

As usual, there will be lots of activity at Oxford Instruments!


We'll be on Booth 724 with the full team of sales, applications, support and senior managers. During the show there will be:

On booth Lunch & Learn sessions:

Hands on demonstrations, box lunches provided (45 mins)


  • Discover a new way to do EDS
    Tuesday 8th, 12:00 - 13:00

    Learn more about our latest developments in both EDS hardware and software

  • Introducing Symmetry - a revolutionary new EBSD detector
    Wednesday 9th, 12:00 - 13:00

    See for yourself how the first CMOS based EBSD detector shatters performance barriers of traditional CCD based sensors. Attend a presentation by our EBSD product manager to understand the technology behind the performance improvement and see application data across several important areas showing the performance on real-life samples.

  • Opening the window - Pushing the limits of low energy EDS with X-Max Extreme
    Wednesday 9th, 12:30 - 13:30 (Jeol Booth #708)

    Learn more about the latest applications of Extreme EDS analysis in the areas of nanotechnology, energy materials and semiconductors and how you can obtain sub 10nm elemental mapping and high resolution, light element analysis of your sample in your SEM.

    *Contact JEOL to register

Learn from the experts:

Short, instructional seminars (30mins)


  • Quantitative analysis and sample thickness measurement in TEM using EDS
    Monday 7th, 14:00 - 14:30

    Attend this tutorial to lean how you can achieve accurate quantitative analysis in the TEM using our new TEM software quantification. Understand the technology behind the sample thickness measurements and automatic absorption correction and learn to apply it to your sample.
  • What EBSD can do for you
    Monday 7th, 15:30 - 16:00

    Whether you are new to EBSD or are looking to learn about how you can get more out of your existing system, this is a chance to attend a short presentation by our EBSD experts to learn more about the diverse range of applications that are possible. There will be a chance to ask questions and learn more about both hardware and software capabilities

  • Sub 5 kV elemental characterisation in the SEM using EDS
    Tuesday 8th, 14:00 - 14:30

    In this short presentation our product manager for X-Max Extreme demonstrates how to unlock new capabilities for your SEM by using very low energy EDS analysis. See how to perform surface science experiments, analyse lithium battery materials and achieve ultra-high spatial resolution for chemical imaging in the SEM.
  • Successful in-situ lift outs
    Wednesday 9th, 14:00 - 14:30

    We all know how frustrating it can be to lose a sample at the lift-out stage after having spent lots of time preparing it. Learn from our product manager for FIB products how to optimise the lift-out process and improve the quality of your sample preparation in the focused ion beam.
  • An Introduction to Feature Analysis with AZtecFeature
    Wednesday 9th, 15:30 - 16:00

    Have you ever wondered whether some of your analysis tasks could be automated? This short presentation by our factory expert on automated particle analysis will give you an overview of automation possibilities and how they are used in a variety of industries and application settings.


In depth sessions exploring advanced analysis and how to get the most out of your system
(60 min)


  • AZtecFeature Masterclass: Getting the most from your Feature Analysis
    Tuesday 9th, 11:00 - 12:00

    Presented by Dr. Matt Hiscock - Head of Product Science & Solutions
    This Masterclass will focus on the practical aspects of particle analysis. You will learn how to optimise your analysis settings to achieve a variety of performance goals and how to optimise an analysis run for both speed and accuracy and will have the chance to explore your own applications questions with an our product expert.

  • TKD Masterclass
    Wednesday 9th, 11:00 - 12:00

    Presented by Dr. Pat Trimby - EBSD Product Manager
    This Masterclass will provide an in depth view of the important aspects of high resolution TKD. Our product expert will cover topics ranging from sample preparation to system optimisations for speed and resolution.

  • EBSD Data Collection Masterclass: Getting the best out of your AZtec system
    Thursday 10th, 10:00 - 11:00

    Presented by Dr. Jenny Goulden, EBSD Business Manager & Dr. Pat Trimby, EBSD Product Manager
    Learn about the advanced capabilities of AZtec to get the best out of your EBSD data acquisition from our experts from our UK factory.

  • EBSD Post Processing Masterclass
    Thursday 10th, 11:00 - 12:00

    Presented by Dr. Pat Trimby - EBSD Product Manager
    Explore the capabilities of our EBSD post-processing software solutions together with the experts from our UK factory.

Demo Slots

At M&M we will be demonstrating our full range of products: EDS, EBSD, WDS & Nanomanipulators. Online booking has now ended, please visit our booth if you request a demo.