AerospaceAerospace - Materials Testing and Verification

Within the aerospace industry and in particular the manufacture and repair of aircraft it is paramount that all materials and processes are regularly monitored to meet the highest standards of safety and control.
 
XRF and OES analysis for the Aerospace Industry

X-ray fluorescence (XRF) and Optical Emission Spectroscopy (OES) are analytical techniques used throughout the aerospace industry to identify specific materials.  They offer a range of benefits including simple, accurate, rapid and traceable analysis leading to improved quality assurance through material verification and cost savings. 
  • Polymers are widely used throughout the aerospace and aviation industries. For example, aircraft fuel tank sealants. In this application manganese dioxide is often used as a curing agent . The XRF benchtop analyser X-Supreme8000 is an easy to use, robust tool used to monitor and control the concentration of manganese in the sealant to ensure the correct properties.
  • PMI–MASTER Pro is a mobile Optical Emission analyser with a high measurement capacity of metallic material, especially when Carbon, Magnesium, Aluminium or Silicon need to be detected.  This analyser is highly robust for all day use, 365 days a year operation and is ideal for incoming inspection of raw material.
  • For Positive Materials Identification (PMI) and quality control the handheld XRF analyser X-MET7000 Series is the tool of choice guaranteeing high performance, reliability, fast and non-destructive materials analysis. 
 

 

Products For This Application

FOUNDRY-MASTER Smart / Optimum

FOUNDRY-MASTER Smart / Optimum

High performance optical emission spectrometers for metals analysis with extremely compact size, fit easily on your desktop

PMI-MASTER Smart

PMI-MASTER Smart

Portable cordless optical emission spectrometer for metal analysis in hard to reach places

EBSD Detector - NordlysMax3

EBSD Detector - NordlysMax3

NordlysMax3: collect, index and display data in real-time at 1580 points per second - even during simultaneous EDS acquisition!

PMI-MASTER Pro2

PMI-MASTER Pro2

Robust, mobile optical emission spectrometer for cordless metals analysis

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

High performance, multisample measurement with the benchtop XRF analyser X-Supreme8000 for process and quality control.

Dr Ziad Melhem of Oxford Instruments NanoScience will be giving a talk at MIT on the enabling technologies, requireā€¦ https://t.co/MDz2SojzYv
5:21 PM - 16 Feb 18
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