XRF Analysis of Silicone Coated PaperSilicone coated release paper and film (the liner) is used globally for applications as diverse as adhesive labels for envelopes, medical plasters to babies diapers. The thin Silicone coating protects the adhesive until it is required to be used in the application, and since Silicone is a relatively expensive material, tight quality control is required to ensure cost-effective optimisation of the manufacturing process.

XRF Analysis of Silicone Coated Paper

The well established and respected analytical technique of Energy Dispersive X-ray Fluorescence (EDXRF) has several benefits for analysing Silicone coated release paper such as; little or no sample preparation, no potential hazardous chemicals, no weighting or volumetric measurements and rapid and accurate analysis.

  • The Lab-X3500 series of instruments have for over 20 years provided the majority of the global release liner manufacturers with a simple to use, very stable, robust and totally reliable way to closely control the Silicone coating. In fact the Lab-X3500, due to its enviable reputation for field proven reliability, and ease of use, has almost become the “industry standard” way to monitor and control Silicone coatings. For Silicone on paper, analysis is as simple as cutting out a disk in a sample holder and loading the holder into the Lab-X. Results are available within a couple of minutes and the instrument can be operated easily by production staff.
  • The X-Supreme8000 measures Silicone on paper and films with equal ease and in addition has a 10 position sample carousel for multi-sample unattended analysis, and an integrated PC for storage of results, etc.

Optimised Silicone on paper application packages are available for both instruments covering Silicone on paper and film, clay coated, and the determination of Silicone extractables.

Products For This Application

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Benchtop XRF Analyser - Lab-X3500

Benchtop XRF Analyser - Lab-X3500

Robust, easy-to-use and field-proven benchtop XRF analyser for bulk analysis in the petrochemical, mining, minerals, cement, ceramics, cosmetics, wood treatment industry.

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

High performance, multisample measurement with the benchtop XRF analyser X-Supreme8000 for process and quality control.

Dr Ziad Melhem of Oxford Instruments NanoScience will be giving a talk at MIT on the enabling technologies, require… https://t.co/MDz2SojzYv
5:21 PM - 16 Feb 18
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