Silicone coated release paper and film (the liner) is used globally for applications as diverse as adhesive labels for envelopes, medical plasters to babies diapers. The thin Silicone coating protects the adhesive until it is required to be used in the application, and since Silicone is a relatively expensive material, tight quality control is required to ensure cost-effective optimisation of the manufacturing process.
XRF Analysis of Silicone Coated Paper
The well established and respected analytical technique of Energy Dispersive X-ray Fluorescence (EDXRF) has several benefits for analysing Silicone coated release paper such as; little or no sample preparation, no potential hazardous chemicals, no weighting or volumetric measurements and rapid and accurate analysis.
The Lab-X3500 series of instruments have for over 20 years provided the majority of the global release liner manufacturers with a simple to use, very stable, robust and totally reliable way to closely control the Silicone coating. In fact the Lab-X3500, due to its enviable reputation for field proven reliability, and ease of use, has almost become the “industry standard” way to monitor and control Silicone coatings. For Silicone on paper, analysis is as simple as cutting out a disk in a sample holder and loading the holder into the Lab-X. Results are available within a couple of minutes and the instrument can be operated easily by production staff.
The X-Supreme8000 measures Silicone on paper and films with equal ease and in addition has a 10 position sample carousel for multi-sample unattended analysis, and an integrated PC for storage of results, etc.
Optimised Silicone on paper application packages are available for both instruments covering Silicone on paper and film, clay coated, and the determination of Silicone extractables.