ElectronicsIn the electronics industry, Energy dispersive X-ray Fluorescence (EDXRF) analysers are used to both identify the content and measure the thickness of metallic coatings on electrical and electronic components from printed circuit boards to connectors.  

The coating is analysed to ensure its ability to enable electrical contact and its solderability.

Metallic coatings of gold, silver, chromium, copper, nickel, tin, zinc can be applied as either a single layer or multi layers, and in all cases careful control of the layer thickness is required to ensure the coating has been applied evenly and cost-effectively.  

XRF analysis is used to improve component reliability assurance through solder alloy composition and coating thickness measurement, also measuring the RoHS (Restriction of Hazardous Substances) elements.

Common application areas for coating thickness for the electronics industry are:

  • Analysis of gold and palladium thickness of electrical contacts, for example Au/Ni/Cu
  • Measurement of solderability on printed circuit boards such as Ag/Cu/Epoxy
  • Through-Hole Thickness Measurement

Products For This Application

Particle analysis in the SEM - AZtecFeature

Particle analysis in the SEM - AZtecFeature

Particle analysis in SEM, specifically optimised for ease-of-use and high-speed sample throughput

EBIC Software

EBIC Software

Quantitative low-noise EBIC/EBAC imaging at high speed, with simultaneous SE and integrated software amplifier control.

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Copper Plating Thickness Gauge - CMI95M

Copper Plating Thickness Gauge - CMI95M

The CMI95M is a handheld copper plating coating thickness gauge that is specifically designed for PCB electronics manufacturers who require quick, easy, accurate and repeatable measurements on printed circuit board substrate materials.

Copper Plating Thickness Gauge - CMI165

Copper Plating Thickness Gauge - CMI165

The CMI165 Copper Plating Gauge is a handheld coating thickness gauge that is specifically designed for PCB electronics manufacturers and copper platers who require quick, easy, accurate and repeatable measurements on hot or cold copper traces or panels.

EDS Software for SEM AZtecEnergy

EDS Software for SEM AZtecEnergy

AZtecEnergy EDS Microanalysis software characterises material composition of samples inside a SEM or FIB. From high speed acquisition, data analysis and reporting of single points, linescans and area mapping.

Plated Through-Hole Measurement Gauge - CMI511

Plated Through-Hole Measurement Gauge - CMI511

The CMI511 Plated Thru-hole Measurement Gauge is a handheld coating thickness gauge that is specifically designed for PCB electronics manufacturers who require quick, easy, accurate and repeatable thru-hole measurements on PCB boards prior to and after etching.

Copper Surface Measurement Gauge - CMI563

Copper Surface Measurement Gauge - CMI563

The CMI563 Copper Surface Measurement Gauge is a handheld coating thickness gauge that is specifically designed for PCB electronics manufacturers who require quick, easy, accurate and repeatable measurements of copper plating on rigid, flexible, single and double-sided or multi-layer PCB boards.

PCB Through-Hole & Copper Surface Measurement Gauge - CMI760

PCB Through-Hole & Copper Surface Measurement Gauge - CMI760

The CMI760 PCB Thru-Hole & Copper Surface Measurement Gauge is a benchtop coating thickness gauge that is specifically designed for PCB electronics manufacturers who require quick, easy, accurate and repeatable measurements.

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Particle analysis in the SEM - AZtecFeature

Particle analysis in the SEM - AZtecFeature

AZtecFeature is an innovative particle characterisation system for the SEM that is specifically optimised for ease-of-use and high-speed sample throughput

X-Strata920

X-Strata920

XRF Coating thickness measurement and materials analysis to improve process and quality control