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EBSD Software AZtecHKL

EBSD Software AZtecHKL

AZtecHKL EBSD software is is a very powerful tool for microstructural characterisation in the SEM or FIB.

Glass X-ray Tubes

Glass X-ray Tubes

Oxford Instruments glass X-ray tubes are recognized for their performance and long life. High flux and spot size stability make our X-ray tubes an ideal solution for demanding applications, such as those requiring continuous operation.

Particle analysis in the SEM - AZtecFeature

Particle analysis in the SEM - AZtecFeature

Particle analysis in SEM, specifically optimised for ease-of-use and high-speed sample throughput

FOUNDRY-MASTER Smart / Optimum

FOUNDRY-MASTER Smart / Optimum

High performance optical emission spectrometers for metals analysis with extremely compact size, fit easily on your desktop

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Radiation Shielded X-ray Tubes

Radiation Shielded X-ray Tubes

Our X-ray tubes are also available with a radiation shielded package, enabling plug and play operation. They are an ideal solution for demanding applications, such as those requiring continuous operation.

PMI-MASTER Smart

PMI-MASTER Smart

Portable cordless optical emission spectrometer for metal analysis in hard to reach places

PMI-MASTER Pro2

PMI-MASTER Pro2

Robust, mobile optical emission spectrometer for cordless metals analysis

TEST-MASTER Pro

TEST-MASTER Pro

Mobile and rugged optical emission spectrometer for precise metals analysis, ideal for continuous operation and automation in heavy industry

FOUNDRY-MASTER Pro

FOUNDRY-MASTER Pro

Laboratory metals analyser FOUNDRY-MASTER Pro for complete professional metal analysis including Low Carbon and Nitrogen measurement performance.

Thin film analysis in the SEM: LayerProbe

Thin film analysis in the SEM: LayerProbe

LayerProbe is a thin film analysis tool that measures the thickness and composition of multiple layers in thin film structures in the SEM. It is an extension to AZtec EDS analysis.

Particle analysis in the SEM - AZtecFeature

Particle analysis in the SEM - AZtecFeature

AZtecFeature is an innovative particle characterisation system for the SEM that is specifically optimised for ease-of-use and high-speed sample throughput

Benchtop XRF Analyser - Lab-X3500

Benchtop XRF Analyser - Lab-X3500

Robust, easy-to-use and field-proven benchtop XRF analyser for bulk analysis in the petrochemical, mining, minerals, cement, ceramics, cosmetics, wood treatment industry.

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

Benchtop XRF Analyser - X-Supreme8000 (+ carousel)

High performance, multisample measurement with the benchtop XRF analyser X-Supreme8000 for process and quality control.

Benchtop NMR Analyser - MQC

Benchtop NMR Analyser - MQC+

A range of cost-effective systems based on Nuclear Magnetic Resonance (NMR) for fast, easy, solvent-free measurement of oil, fat, moisture, fluorine and emulsions.