Microscience Microscopy Conference (MMC 2017)
- United Kingdom
- 03 - 06 July 2017
- Businesses Attending:
Oxford Instruments will be demonstrating the new Symmetry EBSD detector and our X-MaxN 150 EDS detector. Operating at over 3,000 indexed patterns per second (pps), Symmetry balances unprecedented speed with exceptional sensitivity to enable work even at low beam currents and voltages.
Demo slots are being organised now and we expect to be very busy. Book your slot now to avoid disappointment.
Oxford Instruments will be holding a workshop discussing the new Symmetry EBSD detector on Tuesday 4th & Wednesday 5th at out booth #309.
These workshops will have limited numbers, so to learn about this latest technology and ask any questions, be sure to register below.
Start Time: 16:30
Dates: Tuesday 4th & Wednesday 5th July
Location: Booth #309
At MMC we will be presenting multiple posters, full details below.
'The advantages and disadvantages of elemental analysis at temperatures beyond 600°C in the transmission electron microscope’ - Dr. James Sagar
'Developments in AZtec: New Solutions for EBSD' - Dr. Jenny Goulden
'Exploring the advantages of Symmetry: a new CMOS-based EBSD detector' - Dr. Pat Trimby
'Strain analysis in AZtec' - Kim Larsen
'Separation of Hard to Distinguish Phases in Automated Feature Analysis' - Dr. Matt Hiscock
'EBIC-Enabled NanoManipulators - Investigating Dislocations in Multi-crystalline Solar Cells' - Dr. Matt Hiscock
Tuesday 4th July
'Extending developments in 2D microanalysis (EDS and EBSD) to 3D material characterisation' - Dr. John Lindsay