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Oxford Instruments plc, a leading provider of high technology products and systems for industry and research, today announces its Half Year Results for the six months to 30...

Oxford Instruments is delighted to announce Dr Michihisa Yamamoto from the Quantum-Phase Electronic Center, The University of Tokyo, and Center of Emergent Matters, RIKEN,...

Andor, an Oxford Instruments company, is pleased to announce the launch of Dragonfly 200, the latest model of its innovative high-speed confocal imaging platform. Dragonfly...

Oxford Instruments Plasma Technology is pleased to announce that Lasertel Inc of Arizona, US have recently purchased one of their advanced inductively coupled plasma chemical...

More than 25 Andor cameras used in the recent LIGO collaboration responsible for the discovery and observation of a kilonova.

Over the past decade, atomic force microscopes (AFMs) have been instrumental in understanding the nanoscale morphology of photovoltaic (PV) materials, an essential step to...

Oxford Instruments has enabled superior plasma process solutions for its customers in Asia by recently installing state of the art plasma etch equipment in their applications...

The 2nd International Workshop “Atomic Layer Deposition Russia 2017” was held in the Saint Petersburg State Institute of Technology, Russia, from 24-30th September...

Oxford Instruments NanoScience announces the long-term collaboration agreement signed with CASmF Science and Technology Limited (CASmF) in China, to jointly develop high...

Oxford Instruments plc, a leading provider of high technology tools and systems for industry and research, is holding its Annual General Meeting today in which the Chairman,...

Oxford Instruments Plasma Technology is delighted to announce that it has signed an Agent Agreement with Woowon Technology Co. Ltd. in Korea. Woowon, established in 1990, are...

Oxford Instruments plc announced today (August 9) that it intends to increase personnel at its R&D base located at the Industrial Technology Research Institute (ITRI) in...