Oxford Instruments Announces a Major Release of its AZtec Microanalysis System
26 February 2013
Oxford Instruments NanoAnalysis, a world leader in microanalysis software and systems, has announced a major release of AZtec, its solution for EDS and EBSD based analyses. This version of AZtec contains new products, new analysis features, and integrates over. 50 suggestions raised by AZtec users since its launch in April 2010.
The EDS module, AZtecEnergy, incorporates a new software product, LayerProbe, for the non-destructive thickness and composition measurement of thin films and coatings in the SEM. AZtecEnergy also contains an exciting new module ‘AutoPhaseMap’ that extends the usual elemental analysis by automatically mapping the phases present in the specimen. AutoPhaseMap characterises phases in features only 100 nm wide; it can detect phases that are comprised of elements that were not thought to be present at the outset, and it will re-process stored X-ray data from previous acquisitions. Oxford Instruments has released five application notes showing it in action.
AZtecHKL, the AZtec EBSD module, now includes an enhanced re-analysis tool for greater indexing flexibility without needing to reacquire data. In addition, EDS data collected simultaneously with EBSD can now assist in the re-analysis of the original data set. A new forescatter imaging application acquires up to six individual images simultaneously. Default images can be optimised and collected automatically, or mixed in every way to better highlight orientation, topography and atomic number contrasts. Finally, the real-time monitoring of data during acquisition has been extended, increasing the capability to validate data ‘on the fly’.
According to Del Redfern, NanoAnalysis Marketing Director, “Customers really like the new AZtec. It is more powerful, provides a deeper insight into materials characterisation, and adds many usability enhancements that they have suggested.”