Oxford Instruments Asylum Research Introduces the MFP-3D Infinity™ AFM Featuring Powerful New Capabilities and Stunning High Performance
17 April 2014

Oxford Instruments Asylum Research announces the new MFP-3D Infinity Atomic Force Microscope (AFM). The MFP-3D Infinity is the new flagship of the Asylum Research MFP-3D™ AFM family with dramatic performance improvements, new nanomechanical measurement capabilities, and new features that make it simple to get started with tapping mode imaging. Whether you are doing routine imaging tasks or ambitious research projects, the MFP-3D Infinity is ideal for an endless variety of applications with unlimited potential for your research.

“The MFP-3D Infinity has evolved extensively from the original MFP-3D that pioneered closed loop scanning and low noise AFM measurements,” commented Dan Bocek, Project Manager. “The development team used their superior knowledge of AFM physics and technology to accomplish truly remarkable performance improvements. We reduced the XY sensor noise by 70% and slashed the Z sensor noise by more than 85%. Overall system height noise is now only 20pm, a third of what it was on the original MFP-3D. The practical benefit is that our customers can now achieve higher resolution while still enjoying the unmatched versatility of the MFP-3D family. No other AFM beats this combination of performance and flexibility.”

Jason Bemis, Manager, High-level Software, added, “We’ve also introduced new software features that showcase the potential of this new hardware and enhance the capability and greatly improve the ease of use of the new Infinity AFM. Our new Fast Force Curve Mapping mode enables the high speed capture and analysis of force-distance curves. We’ve also developed a new feature called GetStarted™ that does exactly what it says. It helps users get high quality tapping mode images from the very start.”

The MFP-3D Infinity features a large 90µm stage and entirely new control electronics that are located close to the AFM for fast, low noise performance. Flexible signal switching and programmable logic enable future expansion options. The new head and scanner offer greatly improved sensor noise (<35pm in Z and <150pm in X&Y) and higher bandwidth for improved force control and faster imaging. Top and bottom view optics provide a large field of view and diffraction-limited resolution for pinpointing features on your sample.

GetStarted greatly increases AFM productivity. It is an intuitive new feature that automatically sets tapping mode imaging parameters such as setpoint, gain, and scan rate based on your sample roughness and cantilever calibration. Unlike iterative optimization schemes, GetStarted uses a robust predictive algorithm so that accurate data is produced from the very first scan line without the potential of tip and sample damage that is common with other optimization routines that assist with scanning.

The new Fast Force Mapping mode brings Asylum’s market leadership and expertise in force spectroscopy to fast force-distance curves measurements. Operating at up to 300Hz pixel rate, it captures every force curve in the image without missing curves or performing hidden data manipulation. Realtime and offline analysis models calculate modulus, adhesion and other properties, and are user-accessible. Part of the NanomechPro™ Toolkit, Fast Force Mapping is a technique complementary to AM-FM Viscoelastic Mapping mode and Contact Resonance Viscoelastic Mapping Mode.

The MFP-3D Infinity remains compatible with the full range of MFP-3D accessories. No other AFM in the world supports such a wide range of innovative accessories, both practical and unique, for temperature and environmental control, controlled gas or liquid environments and for experiments using external driving forces – ideal for busy multi-user facilities.

Additional information on the MFP-3D Infinity and its entire range of new capabilities, scan techniques, and accessories can be found at www.AsylumResearch.com/Infinity. To receive a quotation, email us at sales@AsylumResearch.com